NI Launches 5G mmWave Test Solution

27d ago
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NI Launches 5G mmWave Test Solution Image Credit: Quality Stock Arts/Bigstockphoto.com

NI (National Instruments) announced the launch of mmWave Vector Signal Transceiver (VST) to address the test challenges of 5G mmWave RFIC transceivers and power amplifiers.

With chipmakers racing to commercialize 5G mmWave technology, engineers face the daunting challenge of accelerating product schedules combined with new and often unsolved technical requirements. NI’s mmWave test solutions address these challenges in both the R&D lab and the high-volume manufacturing environment. 

NI’s solutions use the mmWave VST, which combines an RF signal generator, an RF signal analyzer and integrated switching with 1 GHz of instantaneous bandwidth at frequencies up to 44 GHz. In addition to existing PXI-based characterization systems in the lab, this instrument natively integrates into the NI Semiconductor Test System (STS) for deployment in high-volume manufacturing applications. 5G mmWave STS configurations support up to eight mmWave VST instruments, with integrated IF capabilities, and up to 72 mmWave ports in a tester configuration that is optimized for EVM performance. Choosing a tester built on the modular PXI platform helps engineers adopting STS to quickly integrate new measurement capabilities like 5G into their test cells more cost-effectively and with less risk of delaying time to market.

This product features several innovations to address the test requirements of 5G mmWave devices. The new calibrated integrated switching for up to 32 channels enables improved accuracy of beamforming and phased array measurements without additional infrastructure. The modular head design delivers accurate and cost-effective measurements while preserving forward compatibility with future 5G bands. With these innovations, engineers can simultaneously perform measurements at both 5-21 GHz and 23-44 GHz.

Eric Starkloff, President and COO, NI
In the race to bring 5G technology to market, traditional approaches to RF semiconductor test are struggling to deliver on the flexibility and cost expectations of 5G devices. 

Ray is a news editor at The Fast Mode, bringing with him more than 10 years of experience in the wireless industry.

For tips and feedback, email Ray at ray.sharma(at)thefastmode.com, or reach him on LinkedIn @raysharma10, Facebook @1RaySharma

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