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Anritsu Collaborates with KDDI for LPWA IoT Testing

Clock 10 March 2017
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Anritsu Collaborates with KDDI for LPWA IoT Testing Image Credit: Anritsu

Japan-based test gear maker, Anritsu is partnering with KDDI on connection performance and power consumption tests for Low Power Wide Area (LPWA) used in the IoT market.     

The LTE standards typically used for IoT are standardized by 3GPP as Cat.1, Cat.1+eDRX, and Cat.M1, and globally chip venders are developing and releasing communication chip.

According to Anritsu, to measure the low power consumption performance of IoT devices, tests are performed by connecting an Anritsu base station simulator to the IoT device implementing a communications chip via Cat.1, Cat.1+eDRX, and Cat.M1 on the air interface. 

Anritsu started development targeting the Cat.1+eDRX communication standard for IoT, as well as the latest Cat.M1 standard at an early stage. Following the base station simulators used in the tests with KDDI this time, Anritsu plans support for Radio communications analyzer, and the conformance test system.

Anritsu said that it will continue to provide total measurement solutions for R&D and I&M of IoT devices for various applications such as Smart Home, Smart Factory, and Smart City applications.

Ray is a news editor at The Fast Mode, bringing with him more than 10 years of experience in the wireless industry.

For tips and feedback, email Ray at ray.sharma(at), or reach him on LinkedIn, Facebook 


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